CORD, COIL, JEWEL, SAPPHIRE 10′, 4MM

• High visibility color
  Allows supervisors to easily see that workers are wearing the wrist bands and coil cords
• Rapid retraction strength polyurethane coil cords
  Provides high memory and less coil cord dragging on work surface
• Superior resistor connection strain relief
  Superior reliability. Greatly exceeds ESD S1.1 Bending Life Test. Ongoing testing at 51,596,772 cycles vs. 16,000 requirement
• Patented* contoured spring supported banana plug
  Ensures reliable path-to ground connection expanding banana plug into socket.
• Made in USA at Chino CA facility; date coded
  Superior quality; traceable to manufacturer and lot
• Improved snap design
  Low profile keeps cord from being disconnected
• Spring loaded 4mm stainless steel constant contact snap
  Provides constant electrical contact
• Tensile strength at each end in excess of 30 lbs.
  Longer lasting cord saves money
• One Megohm Series Resistor
  To protect operator from accidental contact with equipment line voltage.
• UL listed
  Independent review of the adequacy of the product’s design.
• Lifetime warranty on coil cord strain relief
  See details
• To see Jewel^® coil cord in use, click here
• Made in the United States of America
  This item is made and stocked in Chino, CA

*U.S. Patent #5951337

Jewel™ Coil Cords meet and exceed the Wrist Band and Wrist Cord requirements of ANSI/ESD S20.20.

Per ESD Handbook TR20.20 paragraph 5.3.2.2.2 Wrist Strap Ground Cord, “At first glance, the ground cord appears to be a relatively simple assembly. However, the design requirements are considerable, given the wide range of user applications and the durability requirements of constant tugging, flexing, and dragging over the edge of workstation tops and equipment chassis.”

Reliable Path-to-Ground: Are you wasting the money spent on ESD control? How many accidental disconnects occur a day at your plant putting your products at risk? Read the Evaluation Engineering Magazine Article, “Solving the Wristband Snap Release Problem“
*Reproduced with Permission,
EE-Evaluation Engineering, June, 2001